conventional tem meaning in Chinese

普通透射电子显微镜

Although this book deals , in the main , with the now well established techniques of analysis in conventional tem , a brief treatment is also given of further techniques of defect analysis such as high voltage electron microscopy ( hvem ) and scanning transmission electron microscopy ( stem ) this treatment is by no means detailed but is included to show that the subject is still developing in an exciting and challenging way
虽然这本书主要讲述目前公认的常规tem分析技术，对于进一步的缺陷分析技术比如高压电子显微镜（ hvem ）和透射电子显微镜法（ stem ）的简单的处理也是有的，但是这种处理并不详尽，只是列举了在令人振奋和富有挑战性的发展中课题中暴露出来的问题。